Yokogawa Test & Measurement Corporation announces the launch of the AQ23211A and AQ23212A optical power meter modules (OPMs) as additions to the AQ2300 series – a multi-application test system for manufacturers of semiconductor devices and optical components such as optical fibers.
Available in both 1-channel and 2-channel variations, these modules inherit the functionality and reliability of the predecessor AQ2200 series while offering new features such as a synchronous connection function between the OPMs and source measure unit (SMU), faster communication speeds within the frame, and faster file transfer speeds outside the frame. By providing a converged, single-chassis photonics-electronics measuring solution, the AQ2300 series delivers substantial space and time savings for customers.
Main Features
1. Fast sampling and data transfer
The AQ23211A/AQ23212A OPMs feature a 20µs averaging time*, enabling faster and more accurate data collection that improves measurement efficiency. Additionally, the transfer time for files containing up to 100,001 data points is now less than one second, enabling high-speed, large-volume data transfer. For optical power logging measurements, the maximum number of data points has increased from 20,001 to 1,000,001.
2. Synchronization with SMU
Part of the development ambition was for the new OPMs to integrate seamlessly with the AQ23811A SMU inside the single-frame AQ2300 series modular multi-application test system. The SMU offers high-quality pulse waveform generation (50µs width), high interoperability, and the ability to perform simultaneous voltage and current measurements. Users can easily synchronize the SMU and OPMs within the frame without any wiring requirements.
The frame features a digital I/O interface that can link to external devices, enabling the AQ2300 to receive measurement start signals and transmit measurement end signals. This feature enhances the system’s flexibility and adaptability, making it suitable for small and medium-sized measurement systems.
* Time for repeating measurements to calculate average value
